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BeCe Braided Probe Pins

Model:

Category: Laser Micro Process Equipment

Exhibitor:

A SINAR TECHNOLOGY CORP.

Booth No: P710

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Description
The Micro-Wipe technology of BeCe™ Contact Buttons brings a revolutionary testing experience:
Perfect Penetration of Oxide Layers: Ensures electrical integrity with every test
Non-Damaging Contact: Protects your valuable design samples
Consistent Contact Impedance: Provides reliable testing data
Multiple Use Lifespan: Significantly reduces overall testing costs

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